chore: graph tooling audit 0 #19691
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chore: graph tooling audit 0 #19691
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Introduces a pattern-based approach for extracting gate variables in the
static analyzer. Key changes:
- Add gate_patterns.hpp with declarative patterns for all gate types:
ARITHMETIC, ELLIPTIC, DELTA_RANGE, LOOKUP, POSEIDON2_INTERNAL/EXTERNAL,
NON_NATIVE_FIELD, MEMORY, DATABUS, and ECC_OP
- Add extract_gate_variables() template method that uses patterns to
extract wire indices based on selector conditions
- Convert most gate extraction methods to use pattern-based extraction:
- ARITHMETIC: Uses pattern with special handling for fix_witness gates
- ELLIPTIC, DELTA_RANGE, LOOKUP, POSEIDON2, NON_NATIVE_FIELD, DATABUS:
Fully converted to pattern-based extraction
- MEMORY: Uses pattern for non-access gates; access gates still handled
by transcript-based methods due to tau-tag constraints
- Add perturbation tests (gate_patterns.test.cpp) that verify patterns
match actual relation constraints by checking that perturbing constrained
wires changes relation output
All 82 existing tests pass. The pattern-based approach provides:
- Automated verification via perturbation testing
- Self-documenting constraint specifications
- Easier maintenance when relations change
Co-Authored-By: Claude Opus 4.5 <noreply@anthropic.com>
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Primary changes:
get_*_gate_connected_componentwithGatePatternstructs that specify the conditions under which each wire is constrained for each gate typeGatePattern's by perturbing relation inputs to empirically check which wires are constrained (gate_patterns.test.cpp)Cleanup:
block_idxwith reference toblockin several places for improved clarity